au.\*:("COSSLETT VE")
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RESOLUTION AND CONTRAST IN THE ELECTRON MICROSCOPE: AN HISTORICAL REVIEWCOSSLETT VE.1982; JOURNAL OF MICROSCOPY (OXFORD); ISSN 0022-2720; GBR; DA. 1982; VOL. 128; NO 1; PP. 23-31; BIBL. 1 P.Article
CURRENT DEVELOPMENTS IN HIGH VOLTAGE ELECTRON MICROSCOPY.COSSLETT VE.1974; J. MICR.; G.B.; DA. 1974; VOL. 100; NO 3; PP. 233-246; BIBL. 2 P. 1/2Article
ELECTRON ENERGY LOSS SPECTROMETRY: MEAN FREE PATHS FOR SOME CHARACTERISTIC X-RAY EXCITATIONSLEAPMAN RD; COSSLETT VE.1976; PHILOS. MAG.; G.B.; DA. 1976; VOL. 33; NO 1; PP. 1-10; BIBL. 23 REF.Article
ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY.BARER R; COSSLETT VE.1968; ACADEMIC.PRESS.LONDON.EDITED.BY.BARER.P.COSSLETT.V.E.; 1968, VOL. 2, P. 1 A 418Miscellaneous
RADIATION DAMAGE IN ELECTRON MICROSCOPY OF ORGANIC MATERIALS: EFFECT OF LOW TEMPERATURESSALIH SM; COSSLETT VE.1975; J. MICR.; G.B.; DA. 1975; VOL. 105; NO 3; PP. 269-276; BIBL. 24 REF.Article